The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2003
Filed:
Nov. 29, 1999
D. Rene Rasmussen, Pittsford, NY (US);
Edul N. Dalal, Webster, NY (US);
Xerox Corporation, Stamford, CT (US);
Abstract
An image quality analysis system is provided for image output devices, such as printers and copiers, that overcomes problems with differences in analysis results caused by use of different image input devices. This is achieved by computing a differential transfer function that makes subsequent analysis device independent. Moreover, the analysis is performed on an image that has been blurred to also reflect absolute image quality metrics as seen by a human observer. By determining the resolving characteristics of the input scanner, the scanned image can be processed, with little or no artifacts, to resemble the image as perceived by a human observer, while at the same time eliminating differences that would arise when using a scanner having a different spatial resolving power.