The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2003
Filed:
Nov. 29, 1999
D. Rene Rasmussen, Pittsford, NY (US);
Edul N. Dalal, Webster, NY (US);
Bimal Mishra, Rochester, NY (US);
Xerox Corporation, Stamford, CT (US);
Abstract
This invention specifically covers one of the many image quality (IQ) metrics that can be part of an overall image quality analysis engine. The specific problem with image quality addressed with this metric is that of a region of a printed (or copied) image, which was intended to have a uniform color, but which shows visible color variations. The color variation can have many different forms, both with respect to the type of color difference and with respect to the spatial nature of the non-uniformities. The image quality analysis system readily distinguishes between non-uniformities in the following different categories, including: (a) amplitude modulated cluster dot halftone patterns; (b) frequency modulated halftone patterns (e.g., stochastic screens); (c) irregular two-dimensional variations from noise; (d) isolated (non-periodic) one-dimensional streaks; (e) periodic, one-dimensional bands; and (f) two-dimensional periodic variations (Moire). The results from the image quality analysis can then be used as a basis for diagnosing machine problems.