The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2005
Filed:
Jan. 30, 2002
Meera Sampath, Penfield, NY (US);
Ronald M. Rockwell, Rochester, NY (US);
D. Rene Rasmussen, Pittsford, NY (US);
Ashok V. Godambe, Pittsford, NY (US);
Eric Jackson, Penfield, NY (US);
Raj Minhas, Webster, NY (US);
Meera Sampath, Penfield, NY (US);
Ronald M. Rockwell, Rochester, NY (US);
D. Rene Rasmussen, Pittsford, NY (US);
Ashok V. Godambe, Pittsford, NY (US);
Eric Jackson, Penfield, NY (US);
Raj Minhas, Webster, NY (US);
Xerox Corporation, Stamford, CT (US);
Abstract
Using a system of computer modules operatively associated with a document processing machine, banding defect analysis is accomplished by analyzing specific test patterns via image processing. The banding defects are characterized in terms of quantitative parameters based on an analysis of the banding defect. Key features are extracted from the banding defect parameters. The key features are analyzed in a diagnostic engine, to determine the possible source of the defect. The identified source is correlated to a recommended repair service procedure. The diagnostic process may be augmented by also including machine data in the analysis.