Chien-Huei Adam Chen

Title: Chien-Huei Adam Chen: Innovator in Defect Classification Technology

Introduction

Chien-Huei Adam Chen is a prominent inventor based in San Jose, CA. He has made significant contributions to the field of defect classification technology, holding a total of 9 patents. His innovative work has advanced the methods used in identifying and classifying defects in various specimens.

Latest Patents

One of his latest patents is a method and system for defect classification. This invention involves acquiring images of a specimen and receiving manual classifications of training defects based on specific attributes. The process includes generating an ensemble learning classifier from the received classifications, establishing confidence thresholds for defect types, and classifying test defects using the generated classifier. The system also calculates confidence levels for test defects and reports those with confidence levels below the threshold for manual classification.

Career Highlights

Chien-Huei Adam Chen has worked with notable companies such as KLA-Tencor Corporation and KLA-Tencor Technologies Corporation. His experience in these organizations has allowed him to refine his skills and contribute to significant advancements in defect classification technologies.

Collaborations

Throughout his career, Chen has collaborated with esteemed colleagues, including Ashok V Kulkarni and Hedong Yang. These collaborations have further enriched his work and led to innovative solutions in the field.

Conclusion

Chien-Huei Adam Chen is a distinguished inventor whose work in defect classification technology has made a lasting impact. His patents and collaborations reflect his commitment to innovation and excellence in his field.