Company Filing History:

11 out of 164,108

International Business Machines Corporation

Years Active: 2000-2017

where 'Filed Patents' based on already Granted Patents

13 patents (USPTO):Sort by Forward Citations

Abstract keywords

1. 9772371 - Voltage-driven intelligent characterization bench for semiconductor (2017-09-26),

2. 9460814 - Memory tester design for soft error rate (SER) failure analysis (2016-10-04),

3. 9043179 - Voltage-driven intelligent characterization bench for semiconductor (2015-05-26),

4. 9006827 - Radiation hardened memory cell and design structures (2015-04-14),

5. 8615373 - Voltage driver for a voltage-driven intelligent characterization bench for semiconductor (2013-12-24),

6. 7602265 - Apparatus for accurate and efficient quality and reliability evaluation of micro electromechanical systems (2009-10-13),

7. 6940285 - Method and apparatus for testing a micro electromechanical device (2005-09-06),

8. 6611146 - Stress testing for semiconductor devices (2003-08-26),

9. 6598182 - Electromigration and extrusion monitor and control system (2003-07-22),

10. 6437956 - Circuit for bipolar transistor stress and qualification (2002-08-20),

11. 6429677 - Method and apparatus for characterization of gate dielectrics (2002-08-06),

12. 6429641 - Power booster and current measuring unit (2002-08-06),

13. 6036358 - System and method for diagnosing mechanical clocks (2000-03-14),

Title: The Innovations of Charles J Montrose

Introduction

Charles J Montrose is a notable inventor based in Clintondale, NY (US). He has made significant contributions to the field of semiconductor testing and memory device analysis. With a total of 13 patents to his name, Montrose has developed innovative methods and systems that enhance the reliability and efficiency of electronic devices.

Latest Patents

Montrose's latest patents include a "Voltage-driven intelligent characterization bench for semiconductor" and a "Memory tester design for soft error rate (SER) failure analysis." The first patent describes a method for testing semiconductor devices using driver channels connected to storage devices. Each driver channel features voltage drivers and optical switches that facilitate the testing process. The second patent outlines a method for determining multi-bit upsets (MBU) during SER testing of memory devices. This method involves comparing generated test data patterns with stored versions to identify errors and analyze their implications.

Career Highlights

Throughout his career, Montrose has worked with prominent companies such as IBM and Globalfoundries Inc. His experience in these organizations has allowed him to refine his skills and contribute to groundbreaking advancements in semiconductor technology.

Collaborations

Montrose has collaborated with talented individuals in the field, including Ping-Chuan Wang and Nicholas J Lowitz. These partnerships have fostered innovation and have led to the development of advanced testing methodologies.

Conclusion

Charles J Montrose's contributions to the field of semiconductor testing and memory device analysis are noteworthy. His innovative patents and collaborations reflect his commitment to advancing technology and improving electronic device reliability.

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