The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 2013

Filed:

Jan. 06, 2011
Applicant:

Charles J. Montrose, Hopewell Junction, NY (US);

Inventor:

Charles J. Montrose, Hopewell Junction, NY (US);

Attorney:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01); G01R 31/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A voltage driver is provided having an input to receive test parameters from a microcontroller. The voltage driver having a first amplifier to provide an input to a first switch, based on the test parameters. The first switch having an output to a first connector such as a probe adapted to be connected to a device under test or DUT. A second switch having an input from a second connector to the device under test, the output of the second switch connected to a ground. A third switch has an input connected to the second switch input, the third switch having an output connected to the first connector to the device under test, wherein the first switch is open, and the second and third switch are closed to set the first connector and the second connector to ground. A buffer is provided such that the microcontroller is sets the test parameters in the first voltage driver, the first voltage driver is adapted to provide test data to the buffer. The device is set such that all of the inputs may be set to ground to minimize the possibility of electrostatic discharge building up on the probes and damaging the DUT.


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