The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6611146 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 26, 2003

Filed:

Jun. 28, 2001
Applicant:
Inventor:

Charles J. Montrose, Clintondale, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/108 ;
U.S. Cl.
CPC ...
G01R 3/108 ;
Abstract

An apparatus for applying a stress voltage to a device under test includes a stress voltage source, a constant voltage circuit having an input connected to the stress voltage source and an output connected to a control circuit for removing stress when current exceeds a predetermined level which is connected to the device under test. The constant voltage circuit provides a constant stress voltage to the device under test. A monitoring circuit measures the stress voltage applied to the device under test, and measures leakage current through the device under test. A switch has inputs connected to outputs of the monitoring circuit, with the switch being capable of sending a selected output or outputs of the monitoring circuit to a measurement system.


Find Patent Forward Citations

Montrose, Charles. (2003). Stress testing for semiconductor devices (U.S. Patent No. 6611146). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6611146

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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