Brian K Cusson

This inventor holds 15 USPTO granted patents, primarily in Process Control. Top assignee: Advanced Micro Devices Corporation. Active years: 2002-2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Brian K Cusson. Retrieved from https://idiyas.com/inventor/brian-k-cusson

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

USPTO Granted Patents = 15

% Patents Active = 66.7

Average Co-Inventor Count = 3.4

ph-index = 7

Forward Citations = 215(Granted Patents)

Company Filing History:

15 out of 13,200

Advanced Micro Devices Corporation

patents

Years Active: 2002-2009

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Areas of Expertise:

Fault Detection

Process Covariance

Adaptive Sampling

Memory Device

Wafer Fabrication

Statistical Process Control

Multi-Level Systems

Error Effects

Controller Output

Data Rate Adjustment

Measurement Data Screening

15 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 7581140 - Initiating test runs based on fault detection results (2009-08-25),

2. 7246290 - Determining the health of a desired node in a multi-level system (2007-07-17),

3. 7117062 - Determining transmission of error effects for improving parametric performance (2006-10-03),

4. 7031793 - Conflict resolution among multiple controllers (2006-04-18),

5. 6991945 - Fault detection spanning multiple processes (2006-01-31),

6. 6985825 - Method and apparatus for adaptive sampling based on process covariance (2006-01-10),

7. 6953697 - Advanced process control of the manufacture of an oxide-nitride-oxide stack of a memory device, and system for accomplishing same (2005-10-11),

8. 6925347 - Process control based on an estimated process result (2005-08-02),

9. 6834211 - Adjusting a trace data rate based upon a tool state (2004-12-21),

10. 6800562 - Method of controlling wafer charging effects due to manufacturing processes (2004-10-05),

11. 6778873 - Identifying a cause of a fault based on a process controller output (2004-08-17),

12. 6766214 - Adjusting a sampling rate based on state estimation results (2004-07-20),

13. 6740534 - Determination of a process flow based upon fault detection analysis (2004-05-25),

14. 6446022 - Wafer fabrication system providing measurement data screening (2002-09-03),

15. 6424876 - Statistical process control system with normalized control charting (2002-07-23),

Title: Brian K Cusson: Innovator in Fault Detection and System Health

Introduction

Brian K Cusson is a prominent inventor based in Austin, TX (US). He has made significant contributions to the field of technology, particularly in fault detection and system health assessment. With a total of 15 patents to his name, Cusson's work has had a substantial impact on the industry.

Latest Patents

Among his latest patents, Cusson has developed a method and apparatus for initiating test runs based on fault detection results. This innovative method involves receiving operational data related to the processing of a workpiece by a processing tool, processing this data to determine fault detection results, and subsequently causing a test run to be performed based on these results. Another notable patent focuses on determining the health of a desired node in a multi-level system. This method includes defining fault models associated with various nodes in the system and determining health values based on these models.

Career Highlights

Brian K Cusson is currently employed at Advanced Micro Devices Corporation, where he continues to push the boundaries of technology. His work has been instrumental in enhancing the reliability and efficiency of processing tools and systems.

Collaborations

Throughout his career, Cusson has collaborated with talented individuals such as Elfido Coss, Jr. and Naomi M Jenkins. These collaborations have fostered innovation and contributed to the success of his projects.

Conclusion

Brian K Cusson is a distinguished inventor whose work in fault detection and system health has paved the way for advancements in technology. His contributions continue to influence the industry and inspire future innovations.

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]