The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 2006
Filed:
Aug. 30, 2002
Howard E. Castle, Austin, TX (US);
Matthew A. Purdy, Austin, TX (US);
Gregory A. Cherry, Austin, TX (US);
Richard J. Markle, Austin, TX (US);
Eric O. Green, Austin, TX (US);
Michael L. Miller, Cedar Park, TX (US);
Brian K. Cusson, Austin, TX (US);
Howard E. Castle, Austin, TX (US);
Matthew A. Purdy, Austin, TX (US);
Gregory A. Cherry, Austin, TX (US);
Richard J. Markle, Austin, TX (US);
Eric O. Green, Austin, TX (US);
Michael L. Miller, Cedar Park, TX (US);
Brian K. Cusson, Austin, TX (US);
Advanced Micro Devices, Inc., Austin, TX (US);
Abstract
A method and apparatus is provided for fault detection spanning multiple processes. The method comprises receiving operational data associated with a first process, receiving operational data associated with a second process, which is downstream to the first process and performing fault detection analysis based on the operational data associated with the first process and second process using a common fault detection unit.