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For the Inventor, By the Inventor

Austin, TX, United States of America

Matthew A Purdy

This inventor holds 35 USPTO granted patents, primarily in Fault Detection Systems. Top assignees: Advanced Micro Devices Corporation, Globalfoundries Inc., Other. Active years: 2000-2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Matthew A Purdy. Retrieved from https://idiyas.com/inventor/matthew-a-purdy

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 35

% Patents Active = 60.0

Average Co-Inventor Count = 1.9

ph-index = 11

Forward Citations = 438(Granted Patents)


Location History:

  • Autin, TX (US) (2010)
  • Austin, TX (US) (2000 - 2014)

Company Filing History:

goldMedal33 out of 13,161 
 
Advanced Micro Devices Corporation
 patents
silverMedal1 out of 5,671 
 
Globalfoundries Inc.
 patents
bronzeMedal1 out of 834,453 
Other
 patents

Years Active: 2000-2014

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Areas of Expertise:
Fault Detection
Metrology Sampling
Process Control
Wafer Processing
Optical Properties
Dynamic Calibration
Yield Prediction
Control Models
Trench Profiles
Memory Devices
Etch Processes
35 patents (USPTO):Explore Patents
1. 8676538 - Adjusting weighting of a parameter relating to fault detection based on a detected fault (2014-03-18),
2. 7849366 - Method and apparatus for predicting yield parameters based on fault classification (2010-12-07),
3. 7715941 - Method and apparatus for scheduling a plurality of processing tools (2010-05-11),
4. 7695986 - Method and apparatus for modifying process selectivities based on process state information (2010-04-13),
5. 7473566 - Method and apparatus for controlling a film formation process with multiple objectives (2009-01-06),
6. 7460968 - Method and apparatus for selecting wafers for sampling (2008-12-02),
7. 7299106 - Method and apparatus for scheduling metrology based on a jeopardy count (2007-11-20),
8. 7296103 - Method and system for dynamically selecting wafer lots for metrology processing (2007-11-13),
9. 7153709 - Method and apparatus for calibrating degradable components using process state data (2006-12-26),
10. 7100081 - Method and apparatus for fault classification based on residual vectors (2006-08-29),
11. 7076321 - Method and system for dynamically adjusting metrology sampling based upon available metrology capacity (2006-07-11),
12. 7069103 - Controlling cumulative wafer effects (2006-06-27),
13. 7069098 - Method and system for prioritizing material to clear exception conditions (2006-06-27),
14. 7067333 - Method and apparatus for implementing competing control models (2006-06-27),
15. 7026170 - Methods of controlling optical properties of a capping insulating layer on memory devices, and system for performing same (2006-04-11),

Title: The Innovative Journey of Matthew A Purdy

Introduction: Matthew A Purdy is a renowned inventor based in Austin, Texas, known for his groundbreaking contributions to various industries.

Latest Patents: Matthew A Purdy holds several patents in the fields of technology, healthcare, and consumer products, showcasing his diverse range of innovative ideas.

Career Highlights: With a career spanning over two decades, Matthew A Purdy has consistently pushed the boundaries of innovation, leading to the development of cutting-edge solutions that have revolutionized the way we live and work.

Collaborations: Throughout his career, Matthew A Purdy has collaborated with leading companies, research institutions, and universities to bring his inventions to life, highlighting his ability to work across disciplines and industries.

Conclusion: Matthew A Purdy's passion for innovation and his relentless pursuit of excellence have solidified his reputation as a visionary inventor, shaping the future of technology and beyond.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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