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Matthew A Purdy

This inventor holds 35 USPTO granted patents, primarily in Fault Detection Systems. Top assignees: Advanced Micro Devices Corporation, Globalfoundries Inc., Other. Active years: 2000-2014.

USPTO Granted Patents = 35

% Patents Active = 60.0

Average Co-Inventor Count = 1.9

ph-index = 11

Forward Citations = 438(Granted Patents)

Location History:

Autin, TX (US) (2010)
Austin, TX (US) (2000 - 2014)

Company Filing History:

33 out of 13,146

Advanced Micro Devices Corporation

1 out of 834,307

Other

patents

Years Active: 2000-2014

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Areas of Expertise:

Fault Detection

Metrology Sampling

Process Control

Wafer Processing

Optical Properties

Dynamic Calibration

Yield Prediction

Control Models

Trench Profiles

Memory Devices

Etch Processes

35 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 8676538 - Adjusting weighting of a parameter relating to fault detection based on a detected fault (2014-03-18),

2. 7849366 - Method and apparatus for predicting yield parameters based on fault classification (2010-12-07),

3. 7715941 - Method and apparatus for scheduling a plurality of processing tools (2010-05-11),

4. 7695986 - Method and apparatus for modifying process selectivities based on process state information (2010-04-13),

5. 7473566 - Method and apparatus for controlling a film formation process with multiple objectives (2009-01-06),

6. 7460968 - Method and apparatus for selecting wafers for sampling (2008-12-02),

7. 7299106 - Method and apparatus for scheduling metrology based on a jeopardy count (2007-11-20),

8. 7296103 - Method and system for dynamically selecting wafer lots for metrology processing (2007-11-13),

9. 7153709 - Method and apparatus for calibrating degradable components using process state data (2006-12-26),

10. 7100081 - Method and apparatus for fault classification based on residual vectors (2006-08-29),

11. 7076321 - Method and system for dynamically adjusting metrology sampling based upon available metrology capacity (2006-07-11),

12. 7069103 - Controlling cumulative wafer effects (2006-06-27),

13. 7069098 - Method and system for prioritizing material to clear exception conditions (2006-06-27),

14. 7067333 - Method and apparatus for implementing competing control models (2006-06-27),

15. 7026170 - Methods of controlling optical properties of a capping insulating layer on memory devices, and system for performing same (2006-04-11),

Title: The Innovative Journey of Matthew A Purdy

Introduction: Matthew A Purdy is a renowned inventor based in Austin, Texas, known for his groundbreaking contributions to various industries.

Latest Patents: Matthew A Purdy holds several patents in the fields of technology, healthcare, and consumer products, showcasing his diverse range of innovative ideas.

Career Highlights: With a career spanning over two decades, Matthew A Purdy has consistently pushed the boundaries of innovation, leading to the development of cutting-edge solutions that have revolutionized the way we live and work.

Collaborations: Throughout his career, Matthew A Purdy has collaborated with leading companies, research institutions, and universities to bring his inventions to life, highlighting his ability to work across disciplines and industries.

Conclusion: Matthew A Purdy's passion for innovation and his relentless pursuit of excellence have solidified his reputation as a visionary inventor, shaping the future of technology and beyond.

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