The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2009
Filed:
Dec. 18, 2002
Applicants:
Alexander J. Pasadyn, Austin, TX (US);
Elfido Coss, Jr., Austin, TX (US);
Brian K. Cusson, Austin, TX (US);
Naomi M. Jenkins, Round Rock, TX (US);
Inventors:
Alexander J. Pasadyn, Austin, TX (US);
Elfido Coss, Jr., Austin, TX (US);
Brian K. Cusson, Austin, TX (US);
Naomi M. Jenkins, Round Rock, TX (US);
Assignee:
Advanced Micro Devices, Inc., Austin, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and apparatus are provided for initiating test runs based on a fault detection result. The method comprises receiving operational data associated with processing of a workpiece by a processing tool, processing the operational data to determine fault detection results; and causing a test run to be performed based on at least a portion of the fault detection results.