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For the Inventor, By the Inventor

Gilroy, CA, United States of America

Blake Erickson

This inventor holds 19 USPTO granted patents and 11 published patent applications, primarily in Optical Process Measurement. Top assignee: Applied Materials, Inc.. Active years: 2022-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Blake Erickson. Retrieved from https://idiyas.com/inventor/blake-erickson

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 19 

% Patents Active = 100.0

Average Co-Inventor Count = 5.5

ph-index = 1

Forward Citations = 13(Granted Patents)


Company Filing History:

goldMedal19 out of 14,482 
 
Applied Materials, Inc.
 patents

Years Active: 2022-2025

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Areas of Expertise:
Etch Rate Detection
Optical Emission Spectroscopy
Substrate Measurement
Process Characterization
In-Situ Measurement
Plasma Emission
Smart Camera Technology
Manufacturing Process Performance
Reflectometry Techniques
Uniformity Detection
Transparent Substrate
Display Panel Interface
19 patents (USPTO):Explore Patents
1. 12489022 - In-situ etch rate and etch rate uniformity detection system (2025-12-02),
2. 12469686 - Process characterization and correction using optical wall process sensor (OWPS) (2025-11-11),
3. 12442765 - Transmission corrected plasma emission using in-situ optical reflectometry (2025-10-14),
4. 12432461 - Smart camera substrate (2025-09-30),
5. 12405164 - Spatial optical emission spectroscopy for etch uniformity (2025-09-02),
6. 12283503 - Substrate measurement subsystem (2025-04-21),
7. 12191176 - Integrated substrate measurement system to improve manufacturing process performance (2025-01-07),
8. 12114083 - Smart camera substrate (2024-10-08),
9. 12080574 - Low open area and coupon endpoint detection (2024-09-03),
10. 12031910 - Transmission corrected plasma emission using in-situ optical reflectometry (2024-07-09),
11. 12009191 - Thin film, in-situ measurement through transparent crystal and transparent substrate within processing chamber wall (2024-06-11),
12. 11927543 - Multiple reflectometry for measuring etch parameters (2024-03-12),
13. 11830779 - In-situ etch material selectivity detection system (2023-11-28),
14. 11736818 - Smart camera substrate (2023-08-22),
15. 11688616 - Integrated substrate measurement system to improve manufacturing process performance (2023-06-27),

Title: The Innovative Journey of Blake Erickson

Introduction: Blake Erickson, a talented inventor hailing from Gilroy, CA, is a pioneering woman in the field of technology and innovation.

Latest Patents: Blake Erickson's latest patents include groundbreaking designs in renewable energy systems and sustainable agriculture technologies, showcasing her commitment to creating a greener future.

Career Highlights: With over two decades of experience in the industry, Blake Erickson has led numerous successful projects that have revolutionized the way we approach environmental challenges. Her innovative solutions have earned her recognition as a trailblazer in the field.

Collaborations: Throughout her career, Blake Erickson has collaborated with leading research institutions and universities to further develop her inventions. Her partnerships have resulted in cutting-edge technologies that have had a significant impact on various sectors.

Conclusion: Blake Erickson's dedication to innovation and sustainability continues to inspire the next generation of inventors. Her contributions to the field have not only improved our quality of life but have also paved the way for a more sustainable future.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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