Company Filing History:
Years Active: 2009-2025
Title: Bert Henning Freitag: Innovator in Charged Particle Microscopy
Introduction
Bert Henning Freitag is a prominent inventor based in Eindhoven, Netherlands. He has made significant contributions to the field of charged particle microscopy, holding a total of 18 patents. His innovative methods and systems have advanced the study of samples, particularly in reducing beam-induced sample damage.
Latest Patents
Freitag's latest patents include a method and system for studying samples using a scanning transmission charged particle microscope with reduced beam-induced sample damage. This method involves providing a scanning transmission charged particle microscope equipped with an illuminator and a scanning unit. It also includes determining a first set of parameter settings for achieving a desired dose at specific sample locations. Another notable patent is for dual speed acquisition for drift-corrected, fast, low dose, adaptive compositional charged particle imaging. This method allows for efficient imaging by scanning a surface region of a sample with a charged particle beam and optimizing the beam dwell time for different regions of interest.
Career Highlights
Freitag has worked with notable companies in the field, including FEI Company and Pei Company. His experience in these organizations has contributed to his expertise in charged particle microscopy and innovation in imaging techniques.
Collaborations
Freitag has collaborated with esteemed colleagues such as Hanno Sebastian Von Harrach and Pleun Dona. These partnerships have further enriched his work and contributed to advancements in the field.
Conclusion
Bert Henning Freitag is a distinguished inventor whose work in charged particle microscopy has led to significant advancements in sample analysis. His innovative patents and collaborations highlight his impact on the field and his commitment to pushing the boundaries of technology.
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