The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 26, 2013
Filed:
Jul. 14, 2011
Applicants:
Sorin Lazar, Eindhoven, NL;
Bert Henning Freitag, Eindhoven, NL;
Peter Christiaan Tiemeijer, Eindhoven, NL;
Inventors:
Sorin Lazar, Eindhoven, NL;
Bert Henning Freitag, Eindhoven, NL;
Peter Christiaan Tiemeijer, Eindhoven, NL;
Assignee:
Fei Company, Hillsboro, OR (US);
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2006.01);
U.S. Cl.
CPC ...
Abstract
A scanning confocal transmission electron microscope includes a descan deflector and a corrector below the sample. The microscope uses a detector that is preferably significantly larger than the resolution of the microscope and is positioned in the real image plane, which provides improved contrast, particularly for light elements.