Barry Becker

Title: Barry Becker: Innovator in Defect Detection Technologies

Introduction

Barry Becker is a notable inventor based in San Jose, California, recognized for his contributions to the field of defect detection technologies. With a total of 3 patents, Becker has developed innovative methods and systems that enhance the efficiency of inspection recipes in various applications.

Latest Patents

Becker's latest patents include groundbreaking work on computer-implemented methods, carrier media, and systems for creating defect samples. One of his methods involves separating defects into bins based on their locations, types, and values for parameters of a detection algorithm. This method allows for the selection of defects from these bins to create a sample that aids in optimizing the parameters of the detection algorithm used in inspection recipes. Another significant patent focuses on generating information for selecting values for parameters of a detection algorithm without user intervention. This method performs scans of wafer areas using default values to detect defects, streamlining the process of selecting parameter values for inspection.

Career Highlights

Throughout his career, Barry Becker has worked with prominent companies in the technology sector, including Kla Instruments Corporation and KLA-Tencor Technologies Corporation. His experience in these organizations has contributed to his expertise in developing advanced inspection systems.

Collaborations

Becker has collaborated with talented professionals in his field, including Chien-Huei (Adam) Chen and Hong Chen. These collaborations have further enriched his work and innovations in defect detection technologies.

Conclusion

Barry Becker's contributions to the field of defect detection through his innovative patents and career experiences highlight his significant role as an inventor. His work continues to influence the development of efficient inspection systems in technology.