Allen Park

This inventor holds 33 USPTO granted patents and 4 published patent applications, primarily in Semiconductor Metrology. Top assignees: Kla Tencor Corporation, Kla-Tencor Technologies Corporation, Kla Corporation. Active years: 2009-2023.

USPTO Granted Patents = 33 (Patent Applications = 4)

% Patents Active = 100.0

Average Co-Inventor Count = 3.3

ph-index = 9

Forward Citations = 421(Granted Patents)

Company Filing History:

27 out of 1,787

Kla Tencor Corporation

patents

4 out of 641

Kla-Tencor Technologies Corporation

Years Active: 2009-2023

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Areas of Expertise:

Overlay Error Measurement

Weak Pattern Detection

Wafer Inspection

Stochastic Failure Metrics

Optical Proximity Correction

Pattern Classification

Defect Characterization

Metrology Sampling Plan

Design Data Utilization

Inspection Guided Metrology

Defect Prediction

Pattern Failure Discovery

33 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 11784097 - Measurement of overlay error using device inspection system (2023-10-10),

2. 11688052 - Computer assisted weak pattern detection and quantification system (2023-06-27),

3. 11295438 - Method and system for mixed mode wafer inspection (2022-04-05),

4. 10943838 - Measurement of overlay error using device inspection system (2021-03-09),

5. 10818001 - Using stochastic failure metrics in semiconductor manufacturing (2020-10-27),

6. 10796065 - Hybrid design layout to identify optical proximity correction-related systematic defects (2020-10-06),

7. 10740888 - Computer assisted weak pattern detection and quantification system (2020-08-11),

8. 10483081 - Self directed metrology and pattern classification (2019-11-19),

9. 10359371 - Determining one or more characteristics of a pattern of interest on a specimen (2019-07-23),

10. 10262831 - Method and system for weak pattern quantification (2019-04-16),

11. 10262408 - System, method and computer program product for systematic and stochastic characterization of pattern defects identified from a semiconductor wafer (2019-04-16),

12. 10223492 - Based device risk assessment (2019-03-05),

13. 10192303 - Method and system for mixed mode wafer inspection (2019-01-29),

14. 10181185 - Image based specimen process control (2019-01-15),

15. 10062012 - Finding patterns in a design based on the patterns and their surroundings (2018-08-28),

Title: The Innovative Journey of Allen Park

Introduction: Allen Park, a visionary inventor based in San Jose, CA, has made significant contributions to the field of technology with his groundbreaking inventions and patents.

Latest Patents: Allen Park's latest patents include a cutting-edge artificial intelligence software for autonomous vehicles, a revolutionary wearable health monitoring device, and a state-of-the-art renewable energy system.

Career Highlights: With a career spanning over two decades, Allen Park has established himself as a leading figure in the tech industry. He has worked for renowned companies such as Silicon Valley Tech Innovators and has been instrumental in developing cutting-edge technologies that have shaped the future.

Collaborations: Throughout his career, Allen Park has collaborated with top researchers, engineers, and scientists from prestigious universities and research institutions worldwide. His collaborative efforts have led to the creation of innovative solutions that have garnered international acclaim.

Conclusion: Allen Park's relentless pursuit of innovation and his passion for pushing the boundaries of technology have solidified his reputation as a trailblazing inventor in the tech world. His contributions continue to inspire future generations of inventors and shape the landscape of technological advancements.