The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 28, 2018

Filed:

Oct. 16, 2015
Applicant:

Kla-tencor Corporation, Milpitas, CA (US);

Inventors:

Allen Park, San Jose, CA (US);

Michael Lennek, San Jose, CA (US);

Assignee:

KLA-Tencor Corp., Milpitas, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/62 (2006.01); G06K 9/46 (2006.01); G06T 7/00 (2017.01); G06T 7/60 (2017.01); G06K 9/52 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6267 (2013.01); G06K 9/4604 (2013.01); G06K 9/52 (2013.01); G06T 7/0004 (2013.01); G06T 7/60 (2013.01); G06T 2207/30148 (2013.01);
Abstract

Methods and systems for finding patterns in a design for a specimen are provided. One system includes one or more computer subsystems configured for searching for a target pattern in a design for a specimen to thereby find multiple instances of the target pattern in the design. The one or more computer subsystems are also configured for separating the multiple instances of the target pattern into different groups based on information for surrounding patterns within a predefined window around the target pattern such that each of the different groups corresponds to a different combination of the target pattern and the surrounding patterns.


Find Patent Forward Citations

Loading…