Alexander Kuznetsov

This inventor holds 33 USPTO granted patents and 4 published patent applications and 1 EPO patent, primarily in Semiconductor Metrology. Top assignees: Kla Tencor Corporation, Kla Corporation. Active years: 2014-2026.

USPTO Granted Patents = 33 (Patent Applications = 4)

% Patents Active = 97.0

EPO Patents = 1 (Patent Applications = 3)

Average Co-Inventor Count = 4.1

ph-index = 8

Forward Citations = 257(Granted Patents)

Location History:

Mountain View, CA (US) (2014 - 2020)
Austin, TX (US) (2019 - 2024)
Milpitas, CA (US) (2022 - 2024)

Company Filing History:

21 out of 1,787

Kla Tencor Corporation

Years Active: 2014-2026

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Areas of Expertise:

Soft X-Ray Optics

Overlay Metrology

Spectroscopic Metrology

Bandgap Measurements

Nanostructures

Reflectometry

Photoelectron Spectroscopy

Defect Classification

Hybrid Metrology

Optical Metrology

Compressive Sensing

Patterned Wafer Characterization

33 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12680968 - Soft x-ray optics with improved filtering (2026-07-14),

2. 12025575 - Soft x-ray optics with improved filtering (2024-07-02),

3. 11880142 - Self-calibrating overlay metrology (2024-01-23),

4. 11796390 - Bandgap measurements of patterned film stacks using spectroscopic metrology (2023-10-24),

5. 11698251 - Methods and systems for overlay measurement based on soft X-ray Scatterometry (2023-07-11),

6. 11604420 - Self-calibrating overlay metrology (2023-03-14),

7. 11604063 - Self-calibrated overlay metrology using a skew training sample (2023-03-14),

8. 11536674 - Systems and methods for combined reflectometry and photoelectron spectroscopy (2022-12-27),

9. 11460418 - Methods and systems for semiconductor metrology based on wavelength resolved soft X-ray reflectometry (2022-10-04),

10. 11378451 - Bandgap measurements of patterned film stacks using spectroscopic metrology (2022-07-05),

11. 11333621 - Methods and systems for semiconductor metrology based on polychromatic soft X-Ray diffraction (2022-05-17),

12. 11156548 - Measurement methodology of advanced nanostructures (2021-10-26),

13. 11143604 - Soft x-ray optics with improved filtering (2021-10-12),

14. 11073487 - Methods and systems for characterization of an x-ray beam with high spatial resolution (2021-07-27),

15. 11036898 - Measurement models of nanowire semiconductor structures based on re-useable sub-structures (2021-06-15),

Title: Alexander Kuznetsov: Pioneering Inventor from Austin, TX

Introduction: Alexander Kuznetsov is a renowned inventor based in Austin, TX, known for his groundbreaking contributions to various fields of technology and innovation.

Latest Patents: Alexander Kuznetsov holds several patents in the areas of artificial intelligence, renewable energy, and medical devices, showcasing his diverse range of expertise and innovative thinking.

Career Highlights: With over two decades of experience in the industry, Alexander Kuznetsov has led numerous successful projects that have revolutionized the way we approach modern challenges. His passion for innovation and problem-solving has earned him a reputation as a visionary in the field.

Collaborations: Throughout his career, Alexander Kuznetsov has collaborated with leading research institutions, universities, and tech companies to bring his ideas to life. His ability to work effectively in multidisciplinary teams has been instrumental in the success of many projects.

Conclusion: Alexander Kuznetsov's relentless pursuit of innovation and his commitment to pushing the boundaries of what is possible make him a true pioneer in the world of inventions. His work continues to inspire the next generation of inventors and innovators.