Kyoto, Japan

Akira Noda

USPTO Granted Patents = 17 

 

Average Co-Inventor Count = 1.3

ph-index = 3

Forward Citations = 117(Granted Patents)


Location History:

  • Nara, JP (2018 - 2022)
  • Kyoto, JP (1996 - 2023)

Company Filing History:


Years Active: 1996-2025

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17 patents (USPTO):Explore Patents

Title: Akira Noda: Innovator in Measurement Technology

Introduction

Akira Noda is a prominent inventor based in Kyoto, Japan, known for his significant contributions to measurement technology. With a total of 17 patents to his name, Noda has developed innovative devices that enhance the accuracy and efficiency of sample measurement processes.

Latest Patents

Among his latest patents is a sample measurement device that includes a measurement unit designed to measure a sample and a controller that analyzes the measurement results. This controller estimates and acquires measurement results under various conditions using a model formula based on results from multiple measurement parameters. Another notable patent is for a peak tracking device, which features a chromatogram acquirer that collects chromatograms based on measurement data. This device includes a peak associator that links peaks from different chromatograms, utilizing advanced techniques to extract and analyze spectral data.

Career Highlights

Noda has worked with esteemed companies such as Shimadzu Corporation and Hitachi, Ltd., where he has honed his skills in developing cutting-edge measurement technologies. His work has significantly impacted the field, leading to advancements that benefit various industries.

Collaborations

Throughout his career, Noda has collaborated with notable colleagues, including Kazuo Hiramoto and Masahiro Tadokoro. These partnerships have fostered innovation and contributed to the success of his projects.

Conclusion

Akira Noda's contributions to measurement technology through his patents and collaborations highlight his role as a leading inventor in the field. His work continues to influence advancements in measurement devices and methodologies.

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