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For the Inventor, By the Inventor

Kyoto, Japan

Akira Noda

This inventor holds 22 USPTO granted patents and 1 published patent application and 2 EPO patents, primarily in Chromatography Analysis. Top assignees: Shimadzu Corporation, Hitachi, Ltd., Japan Atomic Energy Agency. Active years: 1996-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Akira Noda. Retrieved from https://idiyas.com/inventor/akira-noda

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 22 

% Patents Active = 77.3

 

Average Co-Inventor Count = 1.3

ph-index = 3

Forward Citations = 117(Granted Patents)


Location History:

  • Nara, JP (2018 - 2022)
  • Kyoto, JP (1996 - 2023)

Company Filing History:

goldMedal20 out of 3,703 
 
Shimadzu Corporation
 patents
silverMedal1 out of 42,740 
 
Hitachi, Ltd.
 patents
bronzeMedal1 out of 93 
 
Japan Atomic Energy Agency
 patents
4. 1 out of 53,276 
 
Kabushiki Kaisha Toshiba
 patents
where one patent can have more than one assignee

Years Active: 1996-2026

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Areas of Expertise:
Peak Tracking
Chromatography
Data Processing
Waveform Analysis
Mass Analysis
Measurement Device
Calibration Method
Machine Learning
Spectrophotometer
Inference Method
Analysis Assistance
Sample Measurement
22 patents (USPTO):Explore Patents
1. 12644868 - Peak tracking device and peak tracking method (2026-06-02),
2. 12631601 - Chromatography quality control device and chromatography quality control method (2026-05-19),
3. 12613226 - Peak area display device, peak area display method, peak area calculation device and peak area calculation method (2026-04-28),
4. 12535471 - Waveform information inference method and device, and peak waveform processing method and device (2026-01-27),
5. 12530428 - Analysis method and diagnosis assistance method (2026-01-20),
6. 12298285 - Sample measurement device and measurement parameter setting assistance device (2025-05-13),
7. 12292425 - Peak tracking device, peak tracking method and non-transitory computer readable medium storing peak tracking program (2025-05-06),
8. 11681778 - Analysis data processing method and analysis data processing device (2023-06-20),
9. 11341404 - Analysis-data analyzing device and analysis-data analyzing method that calculates or updates a degree of usefulness of each dimension of an input in a machine-learning model (2022-05-24),
10. 10725000 - Chromatogram data processing method and device (2020-07-28),
11. 10429365 - Chromatogram data processing system (2019-10-01),
12. 10416134 - Chromatogram data processing method and chromatogram data processing apparatus (2019-09-17),
13. 10236167 - Peak waveform processing device (2019-03-19),
14. 10198630 - Peak detection method (2019-02-05),
15. 10161793 - Spectrum analysis apparatus and calibration method (2018-12-25),

Title: Akira Noda: Innovator in Measurement Technology

Introduction

Akira Noda is a prominent inventor based in Kyoto, Japan, known for his significant contributions to measurement technology. With a total of 17 patents to his name, Noda has developed innovative devices that enhance the accuracy and efficiency of sample measurement processes.

Latest Patents

Among his latest patents is a sample measurement device that includes a measurement unit designed to measure a sample and a controller that analyzes the measurement results. This controller estimates and acquires measurement results under various conditions using a model formula based on results from multiple measurement parameters. Another notable patent is for a peak tracking device, which features a chromatogram acquirer that collects chromatograms based on measurement data. This device includes a peak associator that links peaks from different chromatograms, utilizing advanced techniques to extract and analyze spectral data.

Career Highlights

Noda has worked with esteemed companies such as Shimadzu Corporation and Hitachi, Ltd., where he has honed his skills in developing cutting-edge measurement technologies. His work has significantly impacted the field, leading to advancements that benefit various industries.

Collaborations

Throughout his career, Noda has collaborated with notable colleagues, including Kazuo Hiramoto and Masahiro Tadokoro. These partnerships have fostered innovation and contributed to the success of his projects.

Conclusion

Akira Noda's contributions to measurement technology through his patents and collaborations highlight his role as a leading inventor in the field. His work continues to influence advancements in measurement devices and methodologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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