The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 20, 2023
Filed:
Aug. 03, 2016
Shimadzu Corporation, Kyoto, JP;
Akira Noda, Kyoto, JP;
SHIMADZU CORPORATION, Kyoto, JP;
Abstract
An analysis data processing method for processing analysis data collected with an analyzing device for each of a plurality of samples, by applying an analytical technique using statistical machine learning to multidimensional analysis data formed by output values obtained from a plurality of channels of a multichannel detector provided in the analyzing device, the method including: acquiring a non-linear regression or non-linear discrimination function expressing analysis data obtained for known samples; calculating a contribution value of each of the output values obtained from the plurality of channels forming the analysis data of the known samples, to the acquired non-linear regression or non-linear discrimination function, based on a differential value of the non-linear regression function or non-linear discrimination function; and identifying one or more of the plurality of channels of the detector, which are to be used for processing analysis data obtained for an unknown sample, based on the contribution value.