The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 2026
Filed:
Apr. 26, 2022
Applicant:
Shimadzu Corporation, Kyoto, JP;
Inventors:
Yuichiro Fujita, Kyoto, JP;
Akira Noda, Kyoto, JP;
Yusuke Tamai, Kyoto, JP;
Yoshihiro Yamada, Kyoto, JP;
Assignee:
SHIMADZU CORPORATION, Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/18 (2006.01); G01N 30/86 (2006.01);
U.S. Cl.
CPC ...
G06F 17/18 (2013.01); G01N 30/8631 (2013.01); G01N 30/8693 (2013.01);
Abstract
An analysis method for analyzing a sample includes a first step of acquiring measurement data including a first signal based on the sample and a second signal based on noise added to the first signal as a result of analysis of the sample, a second step of assuming a shape representing the first signal and a shape representing the second signal and modeling the measurement data using Bayesian inference, and a third step of estimating a probability distribution of characteristics of the sample based on the modeled measurement data.