The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2019

Filed:

Feb. 08, 2018
Applicant:

Shimadzu Corporation, Kyoto-shi, Kyoto, JP;

Inventor:

Akira Noda, Kyoto, JP;

Assignee:

SHIMADZU CORPORATION, Kyoto-shi, Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); H01J 49/40 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0036 (2013.01); H01J 49/40 (2013.01);
Abstract

An upsamplerperforms upsampling based on actual measurement data forming a profile spectrum obtained with a time-of-flight mass spectrometer, to insert interpolation data between the temporally adjacent actual measurement data and make the waveform smoother. Subsequently, a peak waveform processordetermines the centroid position, peak area or other relevant values by performing centroid processing which employs trapezoidal approximation or similar technique. The smoothing of the waveform between adjacent measurement data improves the accuracy of the centroid processing, whereby a systematic error in the estimation of the centroid position or calculation of the peak area is reduced. Therefore, even when the number of data points forming one peak on a measured waveform is small, the centroid position and other kinds of peak information can be obtained with a high level of accuracy, and the performance of qualitative or quantitative determination is thereby improved.


Find Patent Forward Citations

Loading…