The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 2019
Filed:
Sep. 09, 2013
Shimadzu Corporation, Kyoto-shi, Kyoto, JP;
Akira Noda, Nara, JP;
Hiroaki Kozawa, Omihachiman, JP;
SHIMADZU CORPORATION, Kyoto-shi, Kyoto, JP;
Abstract
For a signal waveform to be processed, the continuous wavelet transform is performed with various scale factors, and a wavelet coefficient at each point in time is calculated. On an image showing the strength of the wavelet coefficient with respect to the scale factor and time, ridge lines are detected, and based on these ridge lines, positive and negative peak candidates are extracted, after which an error in the position and width of the peak due to the influence of a neighboring peak is corrected. Subsequently, the degree of non-symmetry of the peak shape or other features are examined to remove false negative peaks due to negative peak artifacts. Subsequently, a true peak cluster, a false peak cluster resulting from the removal of high-frequency components of a high-frequency noise or other causes, and other kinds of peaks are identified, and the obtained result is used to remove false peaks.