The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2025
Filed:
Nov. 29, 2018
Applicant:
Shimadzu Corporation, Kyoto, JP;
Inventor:
Akira Noda, Kyoto, JP;
Assignee:
SHIMADZU CORPORATION, Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 30/86 (2006.01); G01N 30/30 (2006.01);
U.S. Cl.
CPC ...
G01N 30/8665 (2013.01); G01N 30/30 (2013.01); G01N 30/8624 (2013.01); G01N 30/8693 (2013.01); G01N 2030/862 (2013.01);
Abstract
A sample measurement device includes a measurement unit () configured to measure a sample, and a controller () configured to analyze a measurement result of the measurement unit. The controller () is configured to estimate and acquire a measurement result under another measurement condition using a model formula based on measurement results under a plurality of measurement conditions with different measurement parameter conditions, and estimate a distribution of a measurement quality indicator with respect to a measurement parameter based on the estimated measurement result.