The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2020
Filed:
Jan. 06, 2016
Shimadzu Corporation, Kyoto, JP;
Akira Noda, Kyoto, JP;
Shimadzu Corporation, Kyoto, JP;
Abstract
Wavelength spectrums of peaks detected on a chromatogram based on observation data to be processed are extracted to create a spectrum set {S'} in which the intensity values of the spectrums are normalized (S, S). One wavelength spectrum is selected from the set, and a vector of the wavelength spectrum at each point in time of measurement based on the observation data is projected so as to be perpendicular to the vector of the selected spectrum (Sto S). The vectors of the wavelength spectrums in the set {S′ } are also similarly projected (S). Consequently, the selected spectrum is erased from the set {S′}. The processes from Sto Sare repeated until the set {S′ } does not include a spectrum, and the obtained signals are added (S). The signal resulting from the addition is a signal indicating the waveform shape of an unknown baseline. A baseline spectrum is obtained by fitting the signal to a chromatogram at each wavelength obtained from the observation data, and a baseline signal at each wavelength is calculated from the baseline spectrum and the baseline chromatogram. As a result, a baseline can be automatically estimated without setting of a parameter and the like by a user.