% Expired Patents = 25.0

Trademarks = 1

Forward Citations = 51

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6 inventors (with patents filed for the assignee):

Stacy K Firth (2 out of 2 patents)

W Jarrett Campbell (2 out of 5 patents)

Jonathan B Buckheit (1 out of 7 patents)

4. Weidong Wang (1 out of 7 patents)

5. David W Budd (1 out of 1 patent)

6. Anthony John Toprac (1 out of 77 patents)

4 patents: Sort by Forward Citations

1. 6884147 - Method for chemical-mechanical polish control in semiconductor manufacturing (2005-04-26),

2. 6718224 - System and method for estimating error in a manufacturing process (2004-04-06),

3. 6643596 - System and method for controlling critical dimension in a semiconductor manufacturing process (2003-11-04),

4. 6470229 - Semiconductor yield management system and method (2002-10-22),

Company Overview

Yield Dynamics, Inc. is a leading provider of innovative yield management solutions for the semiconductor industry. Our advanced software and services help semiconductor manufacturers optimize productivity, reduce costs, and improve overall efficiency in their manufacturing processes. With a strong focus on technology and data analytics, Yield Dynamics is committed to helping our customers achieve higher yields and greater profitability.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

4 Patents

#544 in Sunnyvale, CA

#14,058 in California

#60,671 in US

Sunnyvale, CA, United States of America

Yield Dynamics, Inc.

Forward Citations = 51

6 inventors:

Stacy K Firth (2 out of 2 patents)

W Jarrett Campbell (2 out of 5 patents)

Jonathan B Buckheit (1 out of 7 patents)

4. Weidong Wang (1 out of 7 patents)

5. David W Budd (1 out of 1 patent)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Yield Dynamics, Inc.. Retrieved from https://idiyas.com/company/yield-dynamics

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]