Los Altos, CA, United States of America

Jonathan B Buckheit


Average Co-Inventor Count = 2.8

ph-index = 2

Forward Citations = 28(Granted Patents)


Location History:

  • Foster City, CA (US) (2002 - 2004)
  • Atherton, CA (US) (2011)
  • Los Altos, CA (US) (2010 - 2013)

Company Filing History:


Years Active: 2002-2013

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7 patents (USPTO):

Title: Innovations of Jonathan B Buckheit

Introduction

Jonathan B Buckheit is a notable inventor based in Los Altos, California. He has made significant contributions to the field of semiconductor technology, holding a total of seven patents. His work focuses on yield management systems and defect analysis in integrated circuits, showcasing his expertise in improving manufacturing processes.

Latest Patents

One of his latest patents is a "Semiconductor yield management system and method." This invention discloses a system that processes a data set containing prediction and response variable values. The system effectively removes prediction variables with missing values and utilizes a tiered splitting method to maximize the use of valid data points. The processed data can generate a model, such as a decision tree, which can be modified by user input. Once the model is complete, statistical analysis tools can analyze the data to identify key yield factors.

Another significant patent is for "Bitmap cluster analysis of defects in integrated circuits." This system allows for defect analysis by inputting a defect data set and selecting a radius value to define bit clusters. The method searches for neighboring fail bits and qualifies them based on the specified radius. If a minimum count of fail bits is met, the search continues until the maximum count is reached. This innovative approach provides aggregation to classify bit clusters and count matches based on user-defined thresholds.

Career Highlights

Jonathan has worked with prominent companies in the semiconductor industry, including Rudolph Technologies, Inc. and Yield Dynamics, Inc. His experience in these organizations has contributed to his development as a leading inventor in yield management and defect analysis.

Collaborations

Throughout his career, Jonathan has collaborated with talented individuals such as Weidong Wang and Tom T Ho. These partnerships have likely enhanced his innovative capabilities and contributed to the success of his projects.

Conclusion

Jonathan B Buckheit's contributions to semiconductor technology through his patents and career achievements highlight his role as a significant inventor in the field. His innovative approaches to yield management and defect analysis continue to influence the industry.

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