% Expired Patents = 66.7

Trademarks = 3

Forward Citations = 5

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11 inventors (with patents filed for the assignee):

Kuan-Chung Chen (3 out of 3 patents)

Cheng-Hui Lin (3 out of 3 patents)

Chia-Pin Sun (2 out of 5 patents)

4. Kuan-Yu Chen (1 out of 84 patents)

5. Chyi-Lang Lai (1 out of 2 patents)

6. Hong-Chi Hung (1 out of 1 patent)

7. Chia-Huang Wang (1 out of 1 patent)

8. Hsin Chieh Lu (1 out of 1 patent)

9. Jung Fu Lee (1 out of 1 patent)

10. Huang-Sheng Cheng (1 out of 1 patent)

11. Cheng-Jung Tsai (1 out of 1 patent)

6 patents: Sort by Forward Citations

1. 11215642 - Electronic test device (2022-01-04),

2. 10566256 - Testing method for testing wafer level chip scale packages (2020-02-18),

3. 10466299 - Electronic test apparatus (2019-11-05),

4. 10281489 - Test signals conduction device (2019-05-07),

5. 8901948 - Wafer probe card (2014-12-02),

6. 7876116 - Compliant chuck for semiconducting device testing and chiller thereof (2011-01-25),

Company Overview

Winway Technology Co., Ltd. is a leading provider of innovative IT solutions for businesses. With a focus on cutting-edge technologies, we help our clients achieve their goals by delivering high-quality products and services. Our expert team is dedicated to providing customized IT solutions that drive success and growth. Visit our website for more information.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

6 Patents

#62 in Kaohsiung

#2,095 in Taiwan

Kaohsiung, Taiwan

Winway Technology Co., Ltd.

Forward Citations = 5

11 inventors:

Kuan-Chung Chen (3 out of 3 patents)

Cheng-Hui Lin (3 out of 3 patents)

Chia-Pin Sun (2 out of 5 patents)

4. Kuan-Yu Chen (1 out of 84 patents)

5. Chyi-Lang Lai (1 out of 2 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Winway Technology Co., Ltd.. Retrieved from https://idiyas.com/company/winway-technology-company

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]