Chia-Pin Sun

Title: Chia-Pin Sun: Innovator in Electronic Testing Technologies

Introduction

Chia-Pin Sun is a notable inventor based in Kaohsiung, Taiwan. He has made significant contributions to the field of electronic testing technologies, holding a total of 5 patents. His work focuses on improving testing methods for electronic components, particularly in the realm of wafer level chip scale packages.

Latest Patents

One of his latest patents is a testing method for wafer level chip scale packages. This method involves a test device that includes a probe card with parallel probe holes and probes that connect to contact electrodes on a wafer substrate. The design ensures that the distance between the axes of adjacent probe holes is equal to the smallest spacing between contact electrodes, not exceeding 0.5 mm. Another significant patent is an electronic test apparatus designed for testing electronic components. This apparatus features a test seat with a metallic main body and spring probes that connect to contact electrodes on a circuit substrate. The inclusion of a temperature sensor in the test seat enhances the testing process.

Career Highlights

Chia-Pin Sun has worked with several companies, including Winway Tech Co., Ltd. and Winway Technology Co., Ltd. His experience in these organizations has allowed him to refine his skills and contribute to advancements in electronic testing technologies.

Collaborations

Chia-Pin Sun has collaborated with notable coworkers such as Ying-Chi Tsai and Yu-Pin Hsu. Their joint efforts have likely played a role in the development of innovative testing solutions.

Conclusion

Chia-Pin Sun's contributions to electronic testing technologies are noteworthy, with multiple patents that enhance the efficiency and effectiveness of testing methods. His work continues to influence the industry and pave the way for future innovations.