Giessen, Germany

Werth Messtechnik Gmbh

Calculating rank
USPTO Granted Patents = 25

% Expired Patents = 56.0


Trademarks = 9

Forward Citations = 259

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31 inventors (with patents filed for the assignee):

goldMedal Ralf Christoph (22 out of 23 patents)

silverMedal Ingomar Schmidt (6 out of 7 patents)

bronzeMedal Wolfgang Rauh (4 out of 4 patents)

4.  Benjamin Hopp (3 out of 6 patents)

5.  Andreas Ettemeyer (2 out of 3 patents)

6.  Sabine Linz-Dittrich (2 out of 3 patents)

7.  Markus Hechler (2 out of 3 patents)

8.  Michael Hammer (2 out of 2 patents)

9.  Matthias Andras (2 out of 2 patents)

10.  Volker Wegner (1 out of 1 patent)

11.  Ulrich Neuschaefer-Rube (1 out of 1 patent)

12.  Matthias Andräs (1 out of 1 patent)

13.  Mehmet Demirel (1 out of 2 patents)

14.  Sebastian Zoeller (1 out of 2 patents)

15.  Stefan Gruenwald (1 out of 2 patents)


Core Competencies:
Coordinate Measuring
Optical Sensor
Non-Contact Measurement
Geometric Evaluation
Tactile Measurement
Surface Properties
Computer Tomography
Measurement Geometry
Illumination Device
Measuring Instrument
Measurement Object
Structure Measurement

25 patents:

Company Overview
Werth Messtechnik GmbH, based in Giessen, Germany, specializes in high-precision measurement technology. The company develops advanced optical and tactile measurement systems, focusing on dimensional metrology and quality assurance across various industries. With a commitment to innovation, Werth integrates cutting-edge technologies to enhance measurement accuracy and efficiency, catering to sectors such as automotive, aerospace, and manufacturing. Their solutions are designed to meet the evolving needs of precision engineering and manufacturing processes.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 27 2026

25 Patents

#1 in Giessen

#1,848 in Germany

#25,748 in the World

Giessen, DE
Giessen, Germany
Forward Citations = 259

31 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Werth Messtechnik Gmbh. Retrieved from https://idiyas.com/company/werth-messtechnik

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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