The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 02, 2021
Filed:
Dec. 11, 2015
Werth Messtechnik Gmbh, Giessen, DE;
Ralf Christoph, Giessen, DE;
Ingomar Schmidt, Erfurt, DE;
Volker Wegner, Staufenberg, DE;
Matthias Andräs, Florstadt, DE;
Ulrich Neuschaefer-Rube, Braunschweig, DE;
Andreas Ettemeyer, Grabs, CH;
Mehmet Demirel, Koblach, AT;
Sabine Linz-Dittrich, Gamprin-Bendern, LI;
Benjamin Hopp, Giessen, DE;
WERTH MESSTECHNIK GMBH, Giessen, DE;
Abstract
A method and device for geometrically determining features of a workpiece, having an image processing sensor having a first beam path, the first beam path comprising at least one front optical unit facing the workpiece to be measured, and an optical splitter being mounted on the side of the front optical unit facing away from the workpiece. The optical splitter connects a second beam path to the image processing beam path, a common beam path being formed, and the second beam path being associated with a second optical sensor, the image processing sensor and the second sensor being designed to directly measure the surface of the workpiece. The front optical unit is formed as a sphere and/or has a longitudinal chromatic aberration.