Staufenberg, Germany

Volker Wegner


 

Average Co-Inventor Count = 9.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Volker Wegner: Innovator in Workpiece Measurement Technology

Introduction

Volker Wegner is a notable inventor based in Staufenberg, Germany. He has made significant contributions to the field of measurement technology, particularly in the geometrical determination of features on workpieces. His innovative approach has led to the development of a unique method and device that enhances precision in measurement processes.

Latest Patents

Wegner holds a patent for a "Method and device for measuring features on workpieces." This invention involves an image processing sensor with a first beam path that includes at least one front optical unit directed towards the workpiece. The optical splitter connects a second beam path to the image processing beam path, allowing for direct measurement of the workpiece's surface. The design incorporates a spherical front optical unit and addresses longitudinal chromatic aberration, showcasing Wegner's commitment to advancing measurement accuracy.

Career Highlights

Volker Wegner is associated with Werth Messtechnik GmbH, a company renowned for its expertise in measurement technology. His work at the company has been instrumental in developing innovative solutions that cater to the needs of various industries. Wegner's dedication to his craft is evident in his patent, which reflects his deep understanding of optical measurement systems.

Collaborations

Wegner has collaborated with esteemed colleagues such as Ralf Christoph and Ingomar Schmidt. Their combined expertise has contributed to the advancement of measurement technologies, fostering an environment of innovation and creativity within their field.

Conclusion

Volker Wegner's contributions to measurement technology exemplify the spirit of innovation. His patented methods and devices are paving the way for more accurate and efficient measurement processes in various applications. His work continues to inspire future advancements in the field.

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