The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 2017
Filed:
Nov. 26, 2010
Ralf Christoph, Giessen, DE;
Matthias Andräes, Florstadt, DE;
Ingomar Schmidt, Buseck, DE;
Markus Hechler, Wetzlar, DE;
Benjamin Hopp, Giessen, DE;
Ralf Christoph, Giessen, DE;
Matthias Andräes, Florstadt, DE;
Ingomar Schmidt, Buseck, DE;
Markus Hechler, Wetzlar, DE;
Benjamin Hopp, Giessen, DE;
WERTH MESSTECHNIK GMBH, Giessen, DE;
Abstract
The invention relates to a method and arrangement for determining structures and/or geometry of a workpiece in a coordinate measuring machine by means of a tactile-optical measuring method, wherein the position of a shaped probe element is determined in at least one direction by means of a first sensor using an optically lateral measuring method, and the position of the shaped probe element is determined in at least one second direction using at least one distance sensor. In order to allow the error-free detection of the shaped probe element using the sensors, the invention proposes that at least one flexible connector element is used in a mounting for fastening the shaped probe element, permeated by the beam path of the first sensor in the beam direction, wherein the connecting element is transparent and/or is disposed severely out of focus with respect to the first sensor.