The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 05, 2007
Filed:
Jul. 05, 2002
Detlef Ferger, Herborn, DE;
Detlef Ferger, Herborn, DE;
Werth Messtechnik GmbH, Giessen, DE;
Abstract
A method and apparatus for measuring surface properties of a workpiece in an extremely precise manner by means of a co-ordinate measuring device (), independently from the material properties of the workpiece. A molded probe element is used which can be displaced along coordinate axes (X, Y, Z), and an optical sensor detects the movement of the probe element on the surface of the workpiece. The optical sensor is an optoelectronic distance sensor, and the molded probe element is displaceably arranged in relation to the distance sensor in such a way that the distance sensor optionally directly measures the surface, or the position of the molded probe element.