The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2016
Filed:
May. 16, 2012
Ralf Christoph, Giessen, DE;
Ingomar Schmidt, Buseck, DE;
Peter Winck, Herborn, DE;
WERTH MESSTECHNIK GMBH, Giessen, DE;
Abstract
A method for generating and evaluating an image of a section of an object using an optical sensor. To generate a bright image, individual images are recorded of a section, of which individual images at least some individual images overlap at least in part in each case, and that to generate the image, the individual images or signals are aligned with respect to one another and superposed to form an overall image as the image of the at least one section, so that the evaluation of the overall image is substantially restricted to the overlapping regions of the individual images and/or the evaluation of the overall image or of a part thereof is brought about on the basis of the overlapping regions of the individual images having the latter.