Forward Citations = 122

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9 inventors (with patents filed for the assignee):

Toshihiko Tanaka (3 out of 123 patents)

Iwao Higashikawa (2 out of 28 patents)

Takeo Watanabe (2 out of 2 patents)

4. Mitsuaki Morigami (2 out of 2 patents)

5. Hiromasa Shibata (1 out of 1 patent)

6. Koichi Okada (1 out of 5 patents)

7. Nobufumi Atoda (1 out of 1 patent)

8. Keisuke Koga (1 out of 1 patent)

9. Tohru Itoh (1 out of 1 patent)

5 patents: Sort by Forward Citations

1. 5434648 - Proximity exposure method and machine therefor (1995-07-18),

2. 5374502 - Resist patterns and method of forming resist patterns (1994-12-20),

3. 5326672 - Resist patterns and method of forming resist patterns (1994-07-05),

4. 5325414 - X-ray mask alignment method and apparatus therefor as well as X-ray mask (1994-06-28),

5. 5182610 - Position detecting method and device therefor as well as aligning device (1993-01-26),

Company Overview

Sortec Corporation is a leading technology company specializing in designing and manufacturing innovative sorting solutions for various industries. With a focus on delivering high-performance and reliable sorting systems, Sortec has established a strong reputation for excellence in the market. The company's cutting-edge technology and commitment to customer satisfaction make Sortec a trusted partner for businesses seeking advanced sorting solutions.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 6 2026

5 Patents

#2,721 in Tokyo

#6,651 in Japan

Tokyo, Japan

Sortec Corporation

Forward Citations = 122

9 inventors:

Toshihiko Tanaka (3 out of 123 patents)

Iwao Higashikawa (2 out of 28 patents)

Takeo Watanabe (2 out of 2 patents)

4. Mitsuaki Morigami (2 out of 2 patents)

5. Hiromasa Shibata (1 out of 1 patent)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Sortec Corporation. Retrieved from https://idiyas.com/company/sortec

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]