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Pittsburgh, PA, United States of America

Solid State Measurements, Inc.

USPTO Granted Patents = 34

% Expired Patents = 73.5

EPO Patents = 1

Forward Citations = 461

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20 inventors (with patents filed for the assignee):

William H Howland (17 out of 20 patents)

Robert J Hillard (11 out of 11 patents)

Robert G Mazur (8 out of 15 patents)

4. William J Alexander (3 out of 5 patents)

5. Robert C Stephenson (3 out of 3 patents)

6. Andre Scherz (2 out of 4 patents)

7. Andrew R Schwartz (2 out of 7 patents)

8. Brian R Bobrzynski (2 out of 2 patents)

9. James Healy, Jr (2 out of 2 patents)

10. Michael John Adams (2 out of 2 patents)

11. Vladimir Vladimirovich Talanov (2 out of 16 patents)

12. John Rogers (1 out of 7 patents)

13. Louison Tan (1 out of 1 patent)

14. Robert L Moreland (1 out of 5 patents)

15. Christine E Kalnas (1 out of 1 patent)

Core Competencies:

Dielectric Constant

Semiconductor Wafer

Electrical Properties

Surface Mobility

Defect Concentration

Non-invasive Measurement

High Temperature Heating

Conductance-Voltage

Threshold Voltage

Doping Concentration

Soft Breakdown

Carrier Lifetime

34 patents: Sort by Forward Citations

1. 7362108 - Method and system for measurement of sidewall damage in etched dielectric structures using a near field microwave probe (2008-04-22),

2. 7327155 - Elastic metal gate MOS transistor for surface mobility measurement in semiconductor materials (2008-02-05),

3. 7304490 - In-situ wafer and probe desorption using closed loop heating (2007-12-04),

4. 7295022 - Method and system for automatically determining electrical properties of a semiconductor wafer or sample (2007-11-13),

5. 7285963 - Method and system for measurement of dielectric constant of thin films using a near field microwave probe (2007-10-23),

6. 7282941 - Method of measuring semiconductor wafers with an oxide enhanced probe (2007-10-16),

7. 7250313 - Method of detecting un-annealed ion implants (2007-07-31),

8. 7190186 - Method and apparatus for determining concentration of defects and/or impurities in a semiconductor wafer (2007-03-13),

9. 7063992 - Semiconductor substrate surface preparation using high temperature convection heating (2006-06-20),

10. 7037734 - Method and apparatus for determining generation lifetime of product semiconductor wafers (2006-05-02),

11. 7026837 - Method and apparatus for determining the dielectric constant of a low permittivity dielectric on a semiconductor wafer (2006-04-11),

12. 7023231 - Work function controlled probe for measuring properties of a semiconductor wafer and method of use thereof (2006-04-04),

13. 7007408 - Method and apparatus for removing and/or preventing surface contamination of a probe (2006-03-07),

14. 7005307 - Apparatus and method for detecting soft breakdown of a dielectric layer of a semiconductor wafer (2006-02-28),

15. 6991948 - Method of electrical characterization of a silicon-on-insulator (SOI) wafer (2006-01-31),

Company Overview

Solid State Measurements, Inc. is a technology-focused company based in Pittsburgh, PA, specializing in advanced measurement solutions. The organization develops innovative instrumentation and systems that cater to various industries, including materials science and engineering. With a strong emphasis on precision and reliability, Solid State Measurements aims to enhance research capabilities and product development through its cutting-edge technologies, contributing to advancements in both academic and industrial applications.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

34 Patents

#72 in Pittsburgh, PA

#366 in Pennsylvania

#10,022 in US

#19,651 in the World

Pittsburgh, PA, United States of America

Solid State Measurements, Inc.

Forward Citations = 461

20 inventors:

William H Howland (17 out of 20 patents)

Robert J Hillard (11 out of 11 patents)

Robert G Mazur (8 out of 15 patents)

4. William J Alexander (3 out of 5 patents)

5. Robert C Stephenson (3 out of 3 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Solid State Measurements, Inc.. Retrieved from https://idiyas.com/company/solid-state-measurements

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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