For the Inventor, By the Inventor

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Pittsburgh, PA, United States of America

Solid State Measurements, Inc.

USPTO Granted Patents = 34

EPO Patents = 1

Forward Citations = 461

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20 inventors (with patents filed for the assignee):

William H Howland (17 out of 19 patents)

Robert J Hillard (11 out of 11 patents)

Robert G Mazur (8 out of 15 patents)

4. William J Alexander (3 out of 5 patents)

5. Robert C Stephenson (3 out of 3 patents)

6. Andre Scherz (2 out of 4 patents)

7. Andrew R Schwartz (2 out of 7 patents)

8. Brian R Bobrzynski (2 out of 2 patents)

9. James Healy, Jr (2 out of 2 patents)

10. Michael John Adams (2 out of 2 patents)

11. Vladimir Vladimirovich Talanov (2 out of 16 patents)

12. John Rogers (1 out of 7 patents)

13. Louison Tan (1 out of 1 patent)

14. Robert L Moreland (1 out of 5 patents)

15. Christine E Kalnas (1 out of 1 patent)

34 patents: Sort by Forward Citations

1. 7362108 - Method and system for measurement of sidewall damage in etched dielectric structures using a near field microwave probe (2008-04-22),

2. 7327155 - Elastic metal gate MOS transistor for surface mobility measurement in semiconductor materials (2008-02-05),

3. 7304490 - In-situ wafer and probe desorption using closed loop heating (2007-12-04),

4. 7295022 - Method and system for automatically determining electrical properties of a semiconductor wafer or sample (2007-11-13),

5. 7285963 - Method and system for measurement of dielectric constant of thin films using a near field microwave probe (2007-10-23),

6. 7282941 - Method of measuring semiconductor wafers with an oxide enhanced probe (2007-10-16),

7. 7250313 - Method of detecting un-annealed ion implants (2007-07-31),

8. 7190186 - Method and apparatus for determining concentration of defects and/or impurities in a semiconductor wafer (2007-03-13),

9. 7063992 - Semiconductor substrate surface preparation using high temperature convection heating (2006-06-20),

10. 7037734 - Method and apparatus for determining generation lifetime of product semiconductor wafers (2006-05-02),

11. 7026837 - Method and apparatus for determining the dielectric constant of a low permittivity dielectric on a semiconductor wafer (2006-04-11),

12. 7023231 - Work function controlled probe for measuring properties of a semiconductor wafer and method of use thereof (2006-04-04),

13. 7007408 - Method and apparatus for removing and/or preventing surface contamination of a probe (2006-03-07),

14. 7005307 - Apparatus and method for detecting soft breakdown of a dielectric layer of a semiconductor wafer (2006-02-28),

15. 6991948 - Method of electrical characterization of a silicon-on-insulator (SOI) wafer (2006-01-31),

Solid State Measurements, Inc. is a leading provider of advanced testing and measurement solutions. With over 20 years of experience, we specialize in designing and manufacturing high-quality electronic test equipment. Our products are widely used in various industries, including aerospace, telecommunications, automotive, and more. We take pride in offering innovative solutions that help our customers enhance productivity, accuracy, and efficiency in their testing processes. Visit our website to explore our wide range of products and learn more about how we can assist your measurement needs.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Dec 9 2025

34 Patents

#56 in Pittsburgh, PA

#365 in Pennsylvania

#9,663 in US

#19,027 in the World

Pittsburgh, PA, United States of America

Solid State Measurements, Inc.

Forward Citations = 461

20 inventors:

William H Howland (17 out of 19 patents)

Robert J Hillard (11 out of 11 patents)

Robert G Mazur (8 out of 15 patents)

4. William J Alexander (3 out of 5 patents)

5. Robert C Stephenson (3 out of 3 patents)

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