Louison Tan

Title: Louison Tan: Innovator in Semiconductor Technology

Introduction

Louison Tan is a notable inventor based in Pittsburgh, PA, who has made significant contributions to the field of semiconductor technology. With a focus on improving the accuracy of electrical property measurements, Tan's work has implications for various applications in electronics and materials science.

Latest Patents

Tan holds a patent for a "Method and system for automatically determining electrical properties of a semiconductor wafer or sample." This innovative method involves measuring the response of a semiconductor wafer to an applied CV-type electrical stimulus. By utilizing a recursive technique, Tan's approach allows for progressively more accurate values of equivalent oxide thickness (CET), maximum capacitance (Cox), flatband voltage (Vfb), and other properties of the semiconductor wafer. The method also enables the determination of equivalent oxide thickness (EOT) based on the most accurate CET values, ensuring that the results are presented in a human-detectable form.

Career Highlights

Tan is currently employed at Solid State Measurements, Inc., where he continues to advance his research and development efforts in semiconductor technology. His work is characterized by a commitment to enhancing measurement techniques that are critical for the semiconductor industry.

Collaborations

Tan collaborates with Robert J. Hillard, contributing to the innovative environment at Solid State Measurements, Inc. Their combined expertise fosters advancements in semiconductor measurement technologies.

Conclusion

Louison Tan's contributions to semiconductor technology through his patented methods demonstrate his innovative spirit and dedication to improving measurement accuracy. His work continues to influence the field and pave the way for future advancements in electronics.