Bethesda, MD, United States of America

Andrew R Schwartz


Average Co-Inventor Count = 3.0

ph-index = 4

Forward Citations = 49(Granted Patents)


Company Filing History:


Years Active: 2004-2008

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7 patents (USPTO):Explore Patents

Title: The Innovative Contributions of Andrew R. Schwartz

Introduction

Andrew R. Schwartz is a notable inventor based in Bethesda, MD, with a significant portfolio of seven patents. His work primarily focuses on advanced measurement techniques in the field of dielectric materials, showcasing his expertise and innovative spirit.

Latest Patents

One of his latest patents is titled "Method and system for measurement of sidewall damage in etched dielectric structures using a near field microwave probe." This invention utilizes near field probes to measure dielectric values of blanket films, allowing for the calculation of sidewall damage in patterned structures. The interaction between the probe and the etched structure is modeled to determine the total capacitance, and the effective dielectric constant is extracted to assess sidewall damage accurately.

Another significant patent is "Method and system for measurement of dielectric constant of thin films using a near field microwave probe." This technique offers a non-contact, non-destructive method for measuring the dielectric constant of low-k films. By analyzing the resonant frequency shift of the near-field microwave resonator, the dielectric constant can be extracted efficiently, simplifying the measurement process.

Career Highlights

Throughout his career, Andrew has worked with several companies, including Neocera, Inc. and Solid State Measurements, Inc. His contributions to these organizations have been instrumental in advancing measurement technologies in the semiconductor industry.

Collaborations

Andrew has collaborated with notable professionals in his field, including Vladimir Vladimirovich Talanov and Robert L. Moreland. These partnerships have further enriched his work and expanded the impact of his inventions.

Conclusion

Andrew R. Schwartz's innovative patents and career achievements highlight his significant contributions to the field of dielectric measurement technologies. His work continues to influence advancements in the industry, showcasing the importance of innovation in scientific research.

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