The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2005
Filed:
Mar. 21, 2003
Robert L. Moreland, Lothian, MD (US);
Hans M. Christen, Knoxville, TN (US);
Vladimir V. Talanov, Greenbelt, MD (US);
Andrew R. Schwartz, Bethesda, MD (US);
Robert L. Moreland, Lothian, MD (US);
Hans M. Christen, Knoxville, TN (US);
Vladimir V. Talanov, Greenbelt, MD (US);
Andrew R. Schwartz, Bethesda, MD (US);
Neocera, Inc., Beltsville, MD (US);
Abstract
A probe for non-destructive determination of complex permittivity of a material and for near field optical microscopy is based on a balanced multi-conductor transmission line structure created on a dielectric substrate member which confines the probing field within a sharply defined sampling volume in the material under study. A method for manufacturing dielectric support member based probes includes anisotropically depositing a 50-100 Å thick underlayer of Cr, Ni, W or Ta onto the dielectric support member, anisotropically depositing conductive material onto the Cr, Ni, W or Ta underlayer, and removing the unwanted conductive material at the sides of the dielectric support member to electrically isolate the created conductive strips.