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Beltsville, MD, United States of America

Neocera, Inc.

USPTO Granted Patents = 26

% Expired Patents = 19.2

EPO Patents = 2

Trademarks = 2

Forward Citations = 439

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26 inventors (with patents filed for the assignee):

Vladimir Vladimirovich Talanov (8 out of 16 patents)

Thirumalai Venky Venkatesan (7 out of 16 patents)

Kolagani S Harshavardhan (7 out of 8 patents)

4. Hans M Christen (6 out of 7 patents)

5. Andrew R Schwartz (5 out of 7 patents)

6. Jeonggoo Kim (4 out of 4 patents)

7. Mikhail Strikovski (4 out of 4 patents)

8. Robert L Moreland (4 out of 5 patents)

9. Lee A Knauss (4 out of 4 patents)

10. Steven M Green (4 out of 5 patents)

11. Solomon Kolagani (3 out of 3 patents)

12. Antonio Orozco (3 out of 3 patents)

13. Alberto Pique (3 out of 3 patents)

14. Steven L Garrahan (2 out of 2 patents)

15. Alfred Benjamin Cawthorne, Iii (2 out of 2 patents)

26 patents: Sort by Forward Citations

1. 11733030 - Method and apparatus for contactless high-resolution determination and control of an object position (2023-08-22),

2. 9651369 - Method and system for in-situ determination of a chemical composition of films during growth process (2017-05-16),

3. 9529035 - Method and system for localization of open defects in electronic devices with a DC squid based RF magnetometer (2016-12-27),

4. 9476951 - DC SQUID based RF magnetometer operating at a bandwidth of 200 MHz and higher (2016-10-25),

5. 7557511 - Apparatus and method utilizing high power density electron beam for generating pulsed stream of ablation plasma (2009-07-07),

6. 7262597 - Hybrid squid microscope with magnetic flux-guide for high resolution magnetic and current imaging by direct magnetic field sensing (2007-08-28),

7. 7190889 - Non-contact heater and method for non-contact heating of a substrate for material deposition (2007-03-13),

8. 7122949 - Cylindrical electron beam generating/triggering device and method for generation of electrons (2006-10-17),

9. 7102363 - Method and system for non-contact measurement of microwave capacitance of miniature structures of integrated circuits (2006-09-05),

10. 7019521 - Fault isolation of circuit defects using comparative magnetic field imaging (2006-03-28),

11. 6959481 - Apertured probes for localized measurements of a material's complex permittivity and fabrication method (2005-11-01),

12. 6943562 - Method and system for non-contact measurement of microwave capacitance of miniature structures of integrated circuits (2005-09-13),

13. 6856140 - System and method for quantitative measurements of a material's complex permittivity with use of near-field microwave probes (2005-02-15),

14. 6680617 - Apertured probes for localized measurements of a material's complex permittivity and fabrication method (2004-01-20),

15. 6632282 - Planetary multi-substrate holder system for material deposition (2003-10-14),

Neocera, Inc. is a leading company specializing in the development and manufacturing of advanced materials and equipment for scientific and industrial applications. With a strong focus on innovation, Neocera designs and produces cutting-edge solutions in areas like thin films, surface science, and nanotechnology. Their wide range of products includes deposition systems, plasma sources, and metrology tools. Neocera serves a diverse customer base consisting of research institutions, universities, government agencies, and high-tech industries worldwide.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Sep 22 2026

26 Patents

#2 in Beltsville, MD

#161 in Maryland

#12,837 in US

#24,735 in the World

Beltsville, MD, United States of America

Neocera, Inc.

Forward Citations = 439

26 inventors:

Vladimir Vladimirovich Talanov (8 out of 16 patents)

Thirumalai Venky Venkatesan (7 out of 16 patents)

Kolagani S Harshavardhan (7 out of 8 patents)

4. Hans M Christen (6 out of 7 patents)

5. Andrew R Schwartz (5 out of 7 patents)

Please report any incorrect information to [email protected]

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