Antonio Orozco

Title: Antonio Orozco: Innovator in Electronic Device Localization

Introduction

Antonio Orozco is a prominent inventor based in Washington, DC, known for his contributions to the field of electronic device localization. With a total of three patents to his name, Orozco has made significant advancements in non-destructive testing methods for electronic devices.

Latest Patents

His latest patents include a method and system for localization of open defects in electronic devices using a DC SQUID based RF magnetometer. This innovative approach allows for the non-destructive localization of open defects by sensing coherent magnetic fields up to 200 MHz and higher. The RF magnetic fields are correlated to the conductive paths layout of the electronic device, enabling precise pinpointing of defects at locations where RF current disappears on the current image. Additionally, Orozco has developed an RF DC SQUID based magnetometer that overcomes frequency limitations associated with noise signals, enhancing the accuracy and efficiency of electronic device testing.

Career Highlights

Orozco's career is marked by his work at Neocera, Inc., where he has applied his expertise in developing advanced technologies for electronic devices. His innovative methods have positioned him as a leader in the field of electronic diagnostics.

Collaborations

Throughout his career, Orozco has collaborated with notable professionals, including Vladimir Vladimirovich Talanov and Alfred Benjamin Cawthorne, III. These collaborations have further enriched his work and contributed to the advancement of technology in electronic device testing.

Conclusion

Antonio Orozco's contributions to the field of electronic device localization through his innovative patents and collaborative efforts highlight his significant impact on technology. His work continues to pave the way for advancements in non-destructive testing methods.