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Vancouver, WA, United States of America

Seh America, Inc.

USPTO Granted Patents = 163

Forward Citations = 1,734

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143 inventors (with patents filed for the assignee):

Richard M Aydelott (16 out of 20 patents)

Oleg V Kononchuk (16 out of 16 patents)

Sergei V Koveshnikov (15 out of 23 patents)

4. Gerald R Dietze (15 out of 16 patents)

5. Zbigniew J Radzimski (10 out of 10 patents)

6. Allen R Boyce (10 out of 10 patents)

7. Douglas G Anderson (8 out of 8 patents)

8. Witawat Wijaranakula (8 out of 8 patents)

9. Mark R Boydston (5 out of 5 patents)

10. Neil A Weaver (5 out of 5 patents)

11. Mark J Greisz (5 out of 5 patents)

12. Aaron L LaBrie (5 out of 5 patents)

13. Sean G Hanna (4 out of 4 patents)

14. Barton V White (4 out of 4 patents)

15. Masami Nakano (4 out of 15 patents)

Core Competencies:

Ammonia Reclamation

Lapping Carrier

Low Pressure Check Valve

High Resistivity Silicon Wafer

Epitaxial Semiconductor Growth

Wafer Contamination Reduction

Crystal Ingot Cutting

Particle Measurement Data

Thermophotovoltaic Generator

Defect Detection

Czochralski Method

Semiconductor Processing Equipment

163 patents: Sort by Forward Citations

1. 7229601 - Ammonia reclamation system (2007-06-12),

2. 7196009 - Lapping carrier, apparatus for lapping a wafer and method of fabricating a lapping carrier (2007-03-27),

3. 7137405 - Low pressure check valve (2006-11-21),

4. 7112509 - Method of producing a high resistivity SIMOX silicon substrate (2006-09-26),

5. 7059943 - Method and apparatus for recycling slurry (2006-06-13),

6. 6896727 - Method of determining nitrogen concentration within a wafer (2005-05-24),

7. 6889684 - Apparatus, system and method for cutting a crystal ingot (2005-05-10),

8. 6849548 - Method of reducing particulate contamination during polishing of a wafer (2005-02-01),

9. 6825487 - Method for isolation of wafer support-related crystal defects (2004-11-30),

10. 6808564 - In-situ post epitaxial treatment process (2004-10-26),

11. 6798526 - Methods and apparatus for predicting oxygen-induced stacking fault density in wafers (2004-09-28),

12. 6794227 - Method of producing an SOI wafer (2004-09-21),

13. 6773932 - System and method for collecting, storing, and displaying process data including particle measurement data (2004-08-10),

14. 6768965 - Methods and computer program products for characterizing a crystalline structure (2004-07-27),

15. 6760403 - Method and apparatus for orienting a crystalline body during radiation diffractometry (2004-07-06),

SEH America, Inc. is a leading manufacturing company specializing in the production of silicon wafers for the semiconductor industry. With over 30 years of experience, SEH America provides high-quality, advanced semiconductor materials to customers worldwide. The company is dedicated to continuous innovation, quality control, and customer satisfaction. Visit their website for more information about their products and services.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Dec 30 2025

163 Patents

#3 in Vancouver, WA

#39 in Washington

#2,356 in US

#4,922 in the World

Vancouver, WA, United States of America

Seh America, Inc.

Forward Citations = 1,734

143 inventors:

Richard M Aydelott (16 out of 20 patents)

Oleg V Kononchuk (16 out of 16 patents)

Sergei V Koveshnikov (15 out of 23 patents)

4. Gerald R Dietze (15 out of 16 patents)

5. Zbigniew J Radzimski (10 out of 10 patents)

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