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Oxford Instruments Analytical Oy

USPTO Granted Patents = 25

% Expired Patents = 32.0

EPO Patents = 6

Trademarks = 1

Forward Citations = 246

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24 inventors (with patents filed for the assignee):

Heikki Sipilä (8 out of 18 patents)

Erkki Tapani Puusaari (4 out of 5 patents)

Pasi Antero Kostamo (3 out of 13 patents)

4. Hans Andersson (3 out of 6 patents)

5. Veikko Kämäräinen (3 out of 3 patents)

6. Seppo Nenonen (3 out of 4 patents)

7. Tero Eklin (3 out of 3 patents)

8. Mikko Krapu (2 out of 3 patents)

9. Esko Juhani Kantonen (2 out of 3 patents)

10. Erkki Sakari Kiuru (2 out of 7 patents)

11. Arttu Luukanen (1 out of 6 patents)

12. Jarmo Leino (1 out of 3 patents)

13. Mikko Järvikivi (1 out of 2 patents)

14. Juha Jouni Kalliopuska (1 out of 1 patent)

15. Tomi Meilahti (1 out of 2 patents)

Core Competencies:

Semiconductor Detector

Radiation Detector

X-Ray Fluorescence

Laser-Induced Breakdown Spectroscopy

Measurement Apparatus

Radiation Window

Gas Tight Window

Patterning Detector Crystal

Optical Emission Spectroscopy

Superconducting Antenna

Leakage Current Collection

Compensation for Fluctuations

25 patents: Sort by Forward Citations

1. 9548402 - Semiconductor radiation detector with large active area, and method for its manufacture (2017-01-17),

2. 9530902 - Two-dimensional guard structure and a radiation detector with the same (2016-12-27),

3. 9310324 - X-ray fluorescence analyzer with safety features (2016-04-12),

4. 9159849 - Semiconductor detector head and a method for manufacturing the same (2015-10-13),

5. 9123837 - Semiconductor detector with radiation shield (2015-09-01),

6. 8921797 - Leakage current collection structure and a radiation detector with the same (2014-12-30),

7. 8494119 - Radiation window, and a method for its manufacturing (2013-07-23),

8. 7727796 - Method for patterning detector crystal using Q-switched laser (2010-06-01),

9. 7660393 - Gas tight radiation window, and a method for its manufacturing (2010-02-09),

10. 7618906 - Window membrane for detector and analyser devices, and a method for manufacturing a window membrane (2009-11-17),

11. 7508906 - Filter for X-ray radiation, and an arrangement for using filtered X-ray radiation for excitation (2009-03-24),

12. 7474730 - Compensation for fluctuations over time in the radiation characteristics of the X-ray source in an XRF analyser (2009-01-06),

13. 7443959 - Selective irradiation of small target area in X-ray fluorescent spectroscopy (2008-10-28),

14. 7426019 - Method and arrangement for non-destructive composition analysis of delicate samples (2008-09-16),

15. 7409037 - X-ray fluorescence analyzer having means for producing lowered pressure, and an X-ray fluorescence measurement method using lowered pressure (2008-08-05),

Company Overview

Oxford Instruments Analytical Oy, based in Espoo, Finland, specializes in advanced analytical instrumentation and solutions. The company focuses on providing high-performance tools for materials characterization, including electron microscopy and spectroscopy technologies. Its innovations cater to a wide range of industries, including semiconductor manufacturing, nanotechnology, and life sciences, supporting research and development efforts globally. The organization is committed to enhancing scientific understanding through precision and reliability in its analytical products.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 13 2026

25 Patents

#31 in Espoo

#140 in Finland

#25,710 in the World

Oxford Instruments Analytical Oy

Forward Citations = 246

24 inventors:

Heikki Sipilä (8 out of 18 patents)

Erkki Tapani Puusaari (4 out of 5 patents)

Pasi Antero Kostamo (3 out of 13 patents)

4. Hans Andersson (3 out of 6 patents)

5. Veikko Kämäräinen (3 out of 3 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Oxford Instruments Analytical Oy. Retrieved from https://idiyas.com/company/oxford-instruments-analytical-oy

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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