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Oxford Instruments Analytical Oy

USPTO Granted Patents = 25

EPO Patents = 6

Trademarks = 1

Forward Citations = 238

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24 inventors (with patents filed for the assignee):

Heikki Sipilä (8 out of 18 patents)

Erkki Tapani Puusaari (4 out of 5 patents)

Pasi Antero Kostamo (3 out of 13 patents)

4. Hans Andersson (3 out of 5 patents)

5. Veikko Kämäräinen (3 out of 3 patents)

6. Seppo Nenonen (3 out of 3 patents)

7. Tero Eklin (3 out of 3 patents)

8. Mikko Krapu (2 out of 3 patents)

9. Esko Juhani Kantonen (2 out of 3 patents)

10. Erkki Sakari Kiuru (2 out of 7 patents)

11. Arttu Luukanen (1 out of 6 patents)

12. Jarmo Leino (1 out of 3 patents)

13. Mikko Järvikivi (1 out of 2 patents)

14. Juha Jouni Kalliopuska (1 out of 1 patent)

15. Tomi Meilahti (1 out of 1 patent)

25 patents: Sort by Forward Citations

1. 9548402 - Semiconductor radiation detector with large active area, and method for its manufacture (2017-01-17),

2. 9530902 - Two-dimensional guard structure and a radiation detector with the same (2016-12-27),

3. 9310324 - X-ray fluorescence analyzer with safety features (2016-04-12),

4. 9159849 - Semiconductor detector head and a method for manufacturing the same (2015-10-13),

5. 9123837 - Semiconductor detector with radiation shield (2015-09-01),

6. 8921797 - Leakage current collection structure and a radiation detector with the same (2014-12-30),

7. 8494119 - Radiation window, and a method for its manufacturing (2013-07-23),

8. 7727796 - Method for patterning detector crystal using Q-switched laser (2010-06-01),

9. 7660393 - Gas tight radiation window, and a method for its manufacturing (2010-02-09),

10. 7618906 - Window membrane for detector and analyser devices, and a method for manufacturing a window membrane (2009-11-17),

11. 7508906 - Filter for X-ray radiation, and an arrangement for using filtered X-ray radiation for excitation (2009-03-24),

12. 7474730 - Compensation for fluctuations over time in the radiation characteristics of the X-ray source in an XRF analyser (2009-01-06),

13. 7443959 - Selective irradiation of small target area in X-ray fluorescent spectroscopy (2008-10-28),

14. 7426019 - Method and arrangement for non-destructive composition analysis of delicate samples (2008-09-16),

15. 7409037 - X-ray fluorescence analyzer having means for producing lowered pressure, and an X-ray fluorescence measurement method using lowered pressure (2008-08-05),

Oxford Instruments Analytical Oy is a leading provider of analytical instruments and solutions for scientific and industrial applications. We specialize in designing, manufacturing, and selling high-quality analytical instruments such as electron microscopes, X-ray spectroscopy systems, and related accessories. Our products are used by researchers, engineers, and manufacturers worldwide to analyze and characterize a wide range of materials and nanoscale structures. With a strong focus on innovation and customer satisfaction, we are committed to providing advanced analytical solutions to meet the evolving needs of our global customer base.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Jan 6 2026

25 Patents

#35 in Espoo

#135 in Finland

#24,961 in the World

Oxford Instruments Analytical Oy

Forward Citations = 238

24 inventors:

Heikki Sipilä (8 out of 18 patents)

Erkki Tapani Puusaari (4 out of 5 patents)

Pasi Antero Kostamo (3 out of 13 patents)

4. Hans Andersson (3 out of 5 patents)

5. Veikko Kämäräinen (3 out of 3 patents)

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