The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 16, 2008
Filed:
May. 04, 2006
Applicant:
Tero Eklin, Espoo, FI;
Inventor:
Tero Eklin, Espoo, FI;
Assignee:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
An arrangement and a method are provided for non-destructively analyzing the composition of a delicate sample. The value of the sample depends at least partly on absence of visual defects. A laser source () produces a pulsed laser beam, and focusing optics () focus said pulsed laser beam into a focal spot on the sample. A sensor () receives and detects optical emissions from particles of the sample excited by said pulsed laser beam. A processing subsystem () produces information of the composition of the sample based on the optical emissions detected by said sensor ().