The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2008
Filed:
May. 05, 2006
Erkki Tapani Puusaari, Espoo, FI;
Hannu Rintamäki, Espoo, FI;
Erkki Tapani Puusaari, Espoo, FI;
Hannu Rintamäki, Espoo, FI;
Abstract
An X-ray fluorescence analyzer has a structure that defines a chamber (). There is a window () to the chamber in a surface that is to come next to a sample () outside the chamber. The window () comprises a foil that is permeable to X-rays. A detector () receives fluorescent X-rays through said window (). A low pressure source () is coupled to the chamber () and configured to controllably lower the pressure of a gaseous medium in the chamber () to a pressure value between 760 torr and 10 torr. The X-ray fluorescence analyzer maintains a lowered pressure of a value between 760 torr and 10 torr in the chamber () for the duration of an X-ray fluorescence measurement.