The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2015
Filed:
May. 31, 2013
Applicant:
Oxford Instruments Analytical Oy, Espoo, FI;
Inventors:
Hans Andersson, Vantaa, FI;
Pasi Kostamo, Espoo, FI;
Veikko Kämäräinen, Helsinki, FI;
Seppo Nenonen, Espoo, FI;
Assignee:
Oxford Instruments Analytical Oy, Espoo, FI;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 31/0216 (2014.01); H01L 31/08 (2006.01); H01L 23/552 (2006.01); G01T 1/24 (2006.01); H01L 31/115 (2006.01); H01L 31/0224 (2006.01);
U.S. Cl.
CPC ...
H01L 31/0216 (2013.01); G01T 1/241 (2013.01); H01L 23/552 (2013.01); H01L 31/02164 (2013.01); H01L 31/022416 (2013.01); H01L 31/085 (2013.01); H01L 31/115 (2013.01);
Abstract
A semiconductor radiation detector includes a bulk layer of semiconductor material. On a first side of said bulk layer is an arrangement of field electrodes and a collection electrode for collecting radiation-induced signal charges from said bulk layer. A radiation shield exists on a second side of said bulk layer, opposite to said first side, which radiation shield selectively overlaps the location of said collection electrode.