The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2009
Filed:
Apr. 26, 2007
Erikki Puusaari, Espoo, FI;
Andy Ellis, Sutton Courtenay, GB;
Erikki Puusaari, Espoo, FI;
Andy Ellis, Sutton Courtenay, GB;
Oxford Instruments Analytical Oy, Espoo, FI;
Abstract
An X-ray fluorescence measurement device comprises an X-ray source and a sample window for allowing X-rays from the X-ray source reach a sample. A filter arrangement between the X-ray source and the sample window includes a first filter layer comprising a first filtering element and a second filter layer including a second filtering element. The atomic number of the second filtering element is greater than the atomic number of the first filtering element. The first filter layer is between the X-ray source and the second filter layer.
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