For the Inventor, By the Inventor

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Singapore, Singapore

Nidec Sv Probe Pte. Ltd.

USPTO Granted Patents = 2

Forward Citations = 2

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9 inventors (with patents filed for the assignee):

Minoru Kato (1 out of 3 patents)

Tadakazu Miyatake (1 out of 1 patent)

Akio Hayashi (1 out of 1 patent)

4. Masaki Naganuma (1 out of 1 patent)

5. Matthias Joseph Chin Chieh Chia (1 out of 1 patent)

6. Cheng Ghee Ong (1 out of 1 patent)

7. Raminderjit Singh (1 out of 1 patent)

8. Son N Dang (1 out of 8 patents)

9. Jordan L Wahl (1 out of 1 patent)

2 patents: Sort by Forward Citations

1. 12076833 - Methods and systems for processing one or more integrated circuit probes (2024-09-03),

2. 11009523 - Probe, inspection jig, and inspection apparatus (2021-05-18),

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USPTO Data Jan 1 1976 - Jan 13 2026

2 Patents

#571 in Singapore

#572 in Singapore

Singapore, Singapore

Nidec Sv Probe Pte. Ltd.

Forward Citations = 2

9 inventors:

Minoru Kato (1 out of 3 patents)

Tadakazu Miyatake (1 out of 1 patent)

Akio Hayashi (1 out of 1 patent)

4. Masaki Naganuma (1 out of 1 patent)

5. Matthias Joseph Chin Chieh Chia (1 out of 1 patent)

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