The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 18, 2021
Filed:
Jul. 07, 2019
Nidec-read Corporation, Kyoto, JP;
Nidec SV Probe Pte. Ltd., Singapore, SG;
Minoru Kato, Kyoto, JP;
Tadakazu Miyatake, Kyoto, JP;
Akio Hayashi, Kyoto, JP;
Masaki Naganuma, Kyoto, JP;
Matthias Joseph Chin Chieh Chia, Singapore, SG;
Cheng Ghee Ong, Singapore, SG;
Raminderjit Singh, Singapore, SG;
Nidec-Read Corporation, Kyoto, JP;
Nidec SV Probe Pte. Ltd., Singapore, SG;
Abstract
A probe is a probe having a substantially bar-like shape and includes a distal end portion with a substantially columnar shape adapted to be in contact with an inspection point provided on a device under test, a base end portion with a substantially columnar shape on an opposite side of the distal end portion, and a main body portion formed in a flat ribbon shape and extended to connect the distal end portion to the base end portion. The distal end portion is provided with a distal end surface inclined relative to and intersecting with an axial center of the probe.